STATISTICAL PROCESS CONTROL USING NEW GENERALIZATION OF EXPONENTIATED MUKHERJEE- ISLAM DISTRIBUTION
Statistical Process Control (SPC) is often used in the area to monitor processes when the quality of interest follows a normal distribution. In practice, it is not always true that the variable of interest follows the normal distribution, but may also follow non-normal distributions. The variable of interest may follow some non-normal distribution such as an exponential distribution or a gamma distribution or any other. The use of control charts designed for a normal distribution may not be workable in this situation and may cause an increase in the proportion of non-conforming products.
In this paper, the techniques of Length Biased distributions have been used to the EMID to the applications of SPC to check the performances of the production process. The main objective of this paper is to introduce a control chart using New Generalization of EMID in order to study the production system and monitor the same.
Keywords: Statistical Process Control (SPC), Control Limits, Length Biased distributions, Exponentiated Mukherjee- Islam Distribution (EMID)